Concern Spectrum (650)

 

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Description

Example

Parameters

 

Description

This report displays an exact X/Y location of the defect as entered at a Data Collect terminal. Additional specific unit information can also be viewed.

The initial list displays the views for each product in order of the number of defects applied to them.

Drill down

Select the Qty in the product row to view all the concern spectrums for that product. Alternatively, select the Qty for a specific view to see its individual concern spectrum.

Selecting one of the values in the concern spectrum will display the defects in that area in one of three ways. This can be modified using the Drilldown Type property:

       Scatter: View a scatter diagram of the types of concern in the selected area.

o       Enlarge the scatter diagram using the Drilldown Magnification property.

o       Enlarge the markers in the scatter diagram using the Marker Size property.

       Defects: View a list of the defects that were reported in the selected area. From within the list you can select an individual defect to see the Single Unit History report for the vehicle that had that defect.

       Trend: View a bar chart showing how defects were recorded over time in the selected area.

Description of color range

The image shows the concerns displayed in a circle, corresponding to the locations where the original defect was entered. The number in the circle represents the number of concerns in that region or circle.

The appropriate color is derived by finding the cell with the highest defect count within the view. It is referred to as the baseline value. Then each cell's relative percentage within that same view is calculated using the baseline value. Cell colors towards the red have the worst quality. Those in the green/white range (or without one) are the best.

Changing rows and columns

Change the number of circles displayed by adjusting # Rows and # Columns. Use a low number to get an overall idea of where most defects are occurring in the view. For a more precise location, set the # Rows and # Columns to a larger number.

Example

Number of Defects by View

Concern Spectrum

Specific Defects in Selected Circle

Select an ID from the list to view the Single Unit History (see here).

Parameters

Parameter

Description

Desired Language

The language the report results will be shown in.

Date Range

Either select a date range from the drop-down list or select a Begin Date and End Date using the two parameters below it.

Begin Date

The start date for the report.

End Date

The end date for the report.

Shift

The shifts to be included in the report.

Model Year

The model year to be included in the report.

Product/Group

The product(s) and product group(s) to be included in the report.

Build Group

The build group(s) to include in the report.

Record Area/Group/Station

The production area, group of stations or station where defects were recorded.

Tracking Point

The last tracking point the unit passed.

Restrict to Units in Sample

Only count defects that went through the specified tracking point.

Responsible Area

The area responsible for the defects occurring.

Responsible Cell

The cell responsible for the defects occurring.

Part

The part(s) to include in the report.

Concern

The concern(s) to include in the report.

Rank(s)

The rank(s) to include in the report.

Group by Product

Group the results by product. Products will be listed in alphabetical order.

Drilldown Type

How to display defect information when drilling into concern spectrum. Can be a Scatter chart, a list of Defects or a defect Trend.

Drilldown Magnification

Magnification for scatter chart, if used.

# Rows

The number of rows to divide the defects by.

# Columns

The number of columns to divide the defects by.

Marker Size

Size of defect markers in scatter chart.

Image Width

Width of image in pixels.

Image Height

Height of image in pixels.

Solid Fill

How transparent should the circles be? Lower number means more transparent.

Limit To

Only show the x highest ranked results.